• DocumentCode
    2798737
  • Title

    Switching losses analysis in MHz integrated synchronous Buck converter to support optimal power stage width segmentation in CMOS technology

  • Author

    Wang, Xiaopeng ; Park, Jinseok ; Van Brunt, Edward Robert ; Huang, Alex Q.

  • Author_Institution
    NSF FREEDM Syst. Center, North Carolina State Univ., Raleigh, NC, USA
  • fYear
    2010
  • fDate
    12-16 Sept. 2010
  • Firstpage
    2718
  • Lastpage
    2724
  • Abstract
    Power stage width segmentation has been verified to be effective to improve the efficiency of MHz integrated synchronous Buck converters (ISBC). However, the theoretical analysis of the relationship between the load current and the power stage width or the number of active baby cells had not yet been established. This paper suggests a breakdown analysis of the transient currents in power FETs and recommends one kind of physical based separation between charging/discharging loss and overlap loss. Furthermore, criteria of the Miller plateau are presented to interpret the difference about overlap loss between the control PFET turning on and off. Moreover, five typical types of energy dissipations due to the charging/discharging process of the parasitic capacitors in power FETs are classified so that the charge/discharge losses in four different switching events can be separately evaluated. On the basis of the aforementioned concepts and analysis, the number of the active baby cells necessary for the optimal power stage segmentation in an example ISBS for portable application can be theoretically predicted. The derived values match well with the simulation results.
  • Keywords
    CMOS integrated circuits; convertors; power field effect transistors; CMOS technology; MHz integrated synchronous buck converter; Miller plateau; active baby cells; breakdown analysis; charging-discharging loss; load current; optimal power stage width segmentation; overlap loss; parasitic capacitors; power FET; switching losses analysis; transient currents; Capacitors; FETs; Inductors; Switches; Switching loss; Transient analysis; Turning; CMOS technology; DC-DC synchronous Buck converter; Integrated circuits; Miller Plateau; Parasitic capacitance; Power conversion efficiency; Power stage width segmentation; Switching loss;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Congress and Exposition (ECCE), 2010 IEEE
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    978-1-4244-5286-6
  • Electronic_ISBN
    978-1-4244-5287-3
  • Type

    conf

  • DOI
    10.1109/ECCE.2010.5618055
  • Filename
    5618055