• DocumentCode
    2798777
  • Title

    Using Dynamic Tracing Sampling to Measure Long Running Programs

  • Author

    Odom, Jeffrey ; Hollingsworth, Jeffrey K. ; DeRose, Luiz ; Ekanadham, Kattamuri ; Sbaraglia, Simone

  • Author_Institution
    University of Maryland
  • fYear
    2005
  • fDate
    12-18 Nov. 2005
  • Firstpage
    59
  • Lastpage
    59
  • Abstract
    Detailed cache simulation can be useful to both system developers and application writers to understand an application’s performance. However, measuring long running programs can be extremely slow. In this paper we present a technique to use dynamic sampling of trace snippets throughout an application’s execution. We demonstrate that our approach improves accuracy compared to sampling a few timesteps at the beginning of execution by judiciously choosing the frequency, as well as the points in the control flow, at which samples are collected. Our approach is validated using the SIGMA tracing and simulation framework for the IBM Power family of processors.
  • Keywords
    Adaptive mesh refinement; Computational modeling; Computer science; Computer simulation; Counting circuits; Educational institutions; Hardware; Instruments; Permission; Sampling methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Supercomputing, 2005. Proceedings of the ACM/IEEE SC 2005 Conference
  • Print_ISBN
    1-59593-061-2
  • Type

    conf

  • DOI
    10.1109/SC.2005.77
  • Filename
    1560011