DocumentCode :
2798876
Title :
An Overview of IDDQ Sensor Techniques
Author :
Roy, S.C. ; Kornfeld, A.
Author_Institution :
MCNC, NC
fYear :
1992
fDate :
1-3 Mar 1992
Firstpage :
26
Lastpage :
30
Keywords :
Bipolar transistors; Bridge circuits; Capacitance; Circuit faults; Circuit testing; Current supplies; Integrated circuit noise; Integrated circuit testing; P-n junctions; Power supplies;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
System Theory, 1992. Proceedings. SSST/CSA 92. The 24th Southeastern Symposium on and The 3rd Annual Symposium on Communications, Signal Processing Expert Systems, and ASIC VLSI Design
ISSN :
0094-2898
Print_ISBN :
0-8186-2665-8
Type :
conf
DOI :
10.1109/SSST.1992.712174
Filename :
712174
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2798876
