• DocumentCode
    2798876
  • Title

    An Overview of IDDQ Sensor Techniques

  • Author

    Roy, S.C. ; Kornfeld, A.

  • Author_Institution
    MCNC, NC
  • fYear
    1992
  • fDate
    1-3 Mar 1992
  • Firstpage
    26
  • Lastpage
    30
  • Keywords
    Bipolar transistors; Bridge circuits; Capacitance; Circuit faults; Circuit testing; Current supplies; Integrated circuit noise; Integrated circuit testing; P-n junctions; Power supplies;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    System Theory, 1992. Proceedings. SSST/CSA 92. The 24th Southeastern Symposium on and The 3rd Annual Symposium on Communications, Signal Processing Expert Systems, and ASIC VLSI Design
  • ISSN
    0094-2898
  • Print_ISBN
    0-8186-2665-8
  • Type

    conf

  • DOI
    10.1109/SSST.1992.712174
  • Filename
    712174
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2798876