Title :
Test Compression Based on Lossy Image Encoding
Author :
Ichihara, Hideyuki ; Iwamoto, Yuka ; Yoshikawa, Yuki ; Inoue, Tomoo
Author_Institution :
Grad. Sch. of Inf. Sci., Hiroshima City Univ., Hiroshima, Japan
Abstract :
Test compression / decompression is one of effective methods for testing today´s VLSI. In this paper, we discuss test compression with image compression algorithms, e.g., JPEG algorithm. Image compression algorithms can not only achieve considerably high compression but also require no additional decompression circuity on a chip under test if the chip includes image decoders. Moreover, we propose a method for generating seeds (or compressed test data) in the case where a JPEG decoder is utilized as a test decompressor. Although JPEG algorithm carries out lossy compression, given a test data, the proposed algorithm can search seeds that can be decompressed to another test data preserving the test quality of the given test data, and produce a small set of seeds with high fault coverage. Experimental results show the proposed method can achieve compression ratio comparable with several previous test compression methods without larger hardware overhead.
Keywords :
VLSI; data compression; decoding; image coding; integrated circuit testing; JPEG decoder; VLSI testing; fault coverage; image compression algorithms; image decoders; lossy image encoding; test compression-decompression; test quality; Circuit faults; Image coding; Matrix converters; Quantization; Search problems; Transform coding; Vectors;
Conference_Titel :
Test Symposium (ATS), 2011 20th Asian
Conference_Location :
New Delhi
Print_ISBN :
978-1-4577-1984-4
DOI :
10.1109/ATS.2011.59