DocumentCode
2798994
Title
Multiscan-based Test Data Compression Using UBI Dictionary and Bitmask
Author
Yu, Yang ; Gang Xi ; Qiao, Liyan
Author_Institution
Dept. of Autom. Test & Control, Harbin Inst. of Technol., Harbin, China
fYear
2011
fDate
20-23 Nov. 2011
Firstpage
279
Lastpage
284
Abstract
In this paper, we propose a test data compression method, which combines the advantages of dictionary-based compression and bit mask-based compression. We present a kind of Unfixed-Based Index (UBI), which uses shorter indexes to represent the slices with higher occurrence frequency, while uses longer indexes to represent the slices with lower occurrence frequency. Then, we adopt efficient bit mask and Max-Degree based Clique Partition Algorithm (MD-CPA) to create as many compatible slices as possible. Moreover, we propose a new Variable Prefix Dual-Run-Length (VPDRL) code to compress the un-compatible slices. To demonstrate the usefulness of our approach, we have applied our scheme on ISCAS´89 benchmarks and compared our results with existing compression techniques. Our algorithm outperforms existing dictionary-based compression and other compression methods.
Keywords
data compression; logic testing; runlength codes; system-on-chip; ISCAS´89 benchmarks; MD-CPA; UBI dictionary; VPDRL code; bitmask-based compression; dictionary-based compression; max-degree based clique partition algorithm; multiscan-based test data compression; uncompatible slice compression; unfixed-based index; variable prefix dual-run-length code; Dictionaries; Encoding; Indexes; Partitioning algorithms; Test data compression; Testing; VPDRL code; bitmask; dictionary; test data compression;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ATS), 2011 20th Asian
Conference_Location
New Delhi
ISSN
1081-7735
Print_ISBN
978-1-4577-1984-4
Type
conf
DOI
10.1109/ATS.2011.69
Filename
6114502
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