Title :
Via-configurable routing architectures and fast design mappability estimation for regular fabrics
Author :
Ran, Y. ; Marek-Sadowska, M.
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
Abstract :
In this paper, we describe a new via-configurable routing architecture which shows much better throughput and performance than the previous structures. We demonstrate how to construct a single-via-mask fabric to reduce further the mask cost, and we analyze the penalties which it incurs. To solve the routability problem commonly existing in fabric-based designs, an efficient white-space allocation scheme is suggested, which provides a fast design convergence and early prediction of the circuit mappability to a given fabric.
Keywords :
circuit layout CAD; network routing; circuit mappability prediction; design mappability estimation; fast design convergence; single-via-mask fabric; via configurable routing architecture; white-space allocation scheme; Circuits; Computer architecture; Costs; Fabrics; Logic design; Manufacturing; Routing; Table lookup; Throughput; White spaces;
Conference_Titel :
Computer-Aided Design, 2005. ICCAD-2005. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7803-9254-X
DOI :
10.1109/ICCAD.2005.1560035