DocumentCode
2799424
Title
A New Architecture to Cross-Fertilize On-Line and Manufacturing Testing
Author
Bernardi, P. ; Reorda, M. Sonza
Author_Institution
Dipt. di Autom. e Inf., Politec. di Torino, Torino, Italy
fYear
2011
fDate
20-23 Nov. 2011
Firstpage
142
Lastpage
147
Abstract
This paper deals with the on-line test of SoCs including cores equipped with BIST circuitry and IEEE 1500 wrappers. A method is proposed, which exploits an Infrastructure IP named OTC to manage the on-line test, the OTC module activates the test and provides the related results under the software control of the CPU, thus allowing the SoC to autonomously and flexibly support the on-line test, both at startup and during the normal operation phase. The main advantage of the proposed method lies in the fact that the same hardware resources used for manufacturing test can be exploited for on-line test. Experimental results gathered on a case study system show the benefits and costs of the approach.
Keywords
built-in self test; integrated circuit testing; modules; system-on-chip; BIST circuitry; CPU software control; IEEE 1500 wrapper; IP infrastructure; OTC module; SoC; cross-fertilize on-line-manufacturing testing; hardware resource; normal operation phase; on-line test controller; Built-in self-test; Computer architecture; Hardware; Manufacturing; Random access memory; Read only memory; System-on-a-chip; BIST; IEEE 1500; On-line test; SoC test;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ATS), 2011 20th Asian
Conference_Location
New Delhi
ISSN
1081-7735
Print_ISBN
978-1-4577-1984-4
Type
conf
DOI
10.1109/ATS.2011.42
Filename
6114527
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