DocumentCode
2799971
Title
Reliability of high-power AlGaAs SQW grinsch lasers
Author
Latta, E. ; Moser, A. ; Oosenbrug, A. ; Gasser, M. ; Forster, Th.
Author_Institution
IBM Research Laboratory Zurich
fYear
1990
fDate
9-14 Sept. 1990
Firstpage
276
Lastpage
276
Abstract
Summary form only given. Detailed analysis of the change of the electro-optical performance of AIGaAs SQW GRINSCH lasers during life test enables a careful assessment of the reliability limits of these devices with respect to their applicability in optical data communication and optical data storage systems.
Keywords
Gas lasers; Laser transitions; Lasers and electrooptics; Optical devices; Optical saturation; Power generation; Temperature; Thermal degradation; Ultraviolet sources;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Laser Conference, 1990. Conference Digest. 12th IEEE International
Conference_Location
Davos, Switzerland
Type
conf
DOI
10.1109/ISLC.1990.764524
Filename
764524
Link To Document