Title :
Distortion and noise performance of bottom-plate sampling mixers
Author :
Yu, Wei ; Leung, Bosco
Author_Institution :
Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada
fDate :
31 May-3 Jun 1998
Abstract :
Distortion and noise in a bottom-plate sampling mixer are analyzed. The method of Volterra series is used to analyze distortion. The effects of continuous time, time varying, and sampling distortions are considered. Frequency domain method is used to analyze thermal noise. The method of stochastic differential equation is used to solve for LO noise. These two noise effects, when combined with LO jitter, give a complete noise picture. The analysis is performed in sampled data domain. Explicit formulas are given to guide the design of bottom-plate sampling mixers
Keywords :
Volterra series; electric distortion; frequency-domain analysis; jitter; mixers (circuits); sampled data circuits; thermal noise; LO jitter; LO noise; Volterra series; bottom-plate sampling mixers; continuous time distortion; frequency domain method; sampled data domain; sampling distortion; stochastic differential equation; thermal noise; time varying distortion; Circuit noise; Circuit simulation; Differential equations; Local oscillators; MOS capacitors; Mixers; Radio frequency; Sampling methods; Stochastic resonance; Switches;
Conference_Titel :
Circuits and Systems, 1998. ISCAS '98. Proceedings of the 1998 IEEE International Symposium on
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-4455-3
DOI :
10.1109/ISCAS.1998.698883
