Title :
The evolution of built-in test for an electrical power generating system (EPGS)
Author :
Dailey, Sandra J. ; Carpenter, William F.
Author_Institution :
Sundstrand Adv. Technol. Group, Rockford, IL, USA
Abstract :
The authors review the history of the EPGS built-in test (BIT), types of BIT, the lessons learned from EPGS BIT evolution, and BIT effectiveness. While earlier fault isolation capabilities relied on analog-based built-in-test (BIT) systems, current designs now use microprocessor-based BIT systems or a combination of the two. It is noted that locations of readouts and types of codes/information play an important part in BIT utilization
Keywords :
automatic test equipment; automatic testing; fault location; microcomputer applications; power system measurement; ATE; built-in test; effectiveness; electrical power generating system; fault isolation capabilities; fault location; microprocessor application; Built-in self-test; Displays; Logic; Maintenance; Microprocessors; Military aircraft; Nonvolatile memory; Personnel; Power generation; Protection;
Conference_Titel :
Aerospace and Electronics Conference, 1989. NAECON 1989., Proceedings of the IEEE 1989 National
Conference_Location :
Dayton, OH
DOI :
10.1109/NAECON.1989.40218
