Title :
Ba(X1/3Ta2/3)O3 complex perovskites for microwave and millimeter-wave applications
Author :
Nedelcu, L. ; Busuioc, C. ; Banciu, M.G. ; Ramer, Rodica
Author_Institution :
Nat. Inst. of Mater. Phys., Bucharest-Magurele, Romania
Abstract :
Ba(X1/3Ta2/3)O3 (X=Zn, Mg) perovskites were prepared by using the solid state reaction method. X-ray diffraction and scanning electron microscopy were employed for structural and morphological characterization of Ba(X1/3Ta2/3)O3 samples. The dielectric constant of the resonators was 28 for Ba(Zn1/3Ta2/3)O3 and 24 for Ba(Mg1/3Ta2/3)O3. A strong influence of the cation ordering on the dielectric loss has been found. The achieved values of Q × f product, ranging from 100 to 200 THz, make Ba(X1/3Ta2/3)O3 dielectric resonators attractive for microwave and millimetre-wave applications.
Keywords :
X-ray diffraction; dielectric losses; dielectric resonators; X-ray diffraction; canning electron microscopy; cation ordering; complex perovskites; dielectric constant; dielectric loss; dielectric resonators; microwave application; millimeter wave application; morphological characterization; solid state reaction method; Dielectric constant; Microwave communication; Microwave filters; Microwave integrated circuits; Microwave oscillators; Ba(Mg1/3Ta2/3)O3; Ba(Zn1/3Ta2/3)O3; Complex perovskites; dielectric resonators;
Conference_Titel :
Semiconductor Conference (CAS), 2012 International
Conference_Location :
Sinaia
Print_ISBN :
978-1-4673-0737-6
DOI :
10.1109/SMICND.2012.6400778
