Optimization of self-mixing modulation in VCSELs for sensing applications

Author

Larsson, David ; Yvind, Kresten ; Hvam, Jørn M.

Author_Institution

Dept. of Photonics Eng., Tech. Univ. of Denmark, Lyngby, Denmark

fYear

2009

fDate

14-19 June 2009

Firstpage

1

Lastpage

1

Abstract

This paper numerically investigates, SMI in an oxide aperture VCSEL to optimize the epitaxial structure for higher performance. The standard investigated structure is emitting light at 970 nm from In_0.17Ga_0.83As-GaAsP QWs sandwiched between 36 pairs of bottom mirror and 23 pairs of top mirror (Al_xGa_1-xAs). The calculations are based on matrix multiplication for calculating effective reflectivity and transmission with external feedback, combined with a logarithmic gain model and standard laser rate equations. To improve the sensitivity towards self-mixing interference in VCSELs by simple epitaxial means and this should enable us to e.g. measure smaller bending deflections of cantilever sensors

Keywords

III-V semiconductors; gallium arsenide; gallium compounds; indium compounds; laser cavity resonators; laser feedback; laser mirrors; measurement by laser beam; optical modulation; optical sensors; semiconductor epitaxial layers; surface emitting lasers; In_0.17Ga_0.83As-GaAsP; bending deflection measurement; epitaxial structure optimization; external feedback transmission; logarithmic gain model; mirror; oxide aperture VCSEL; reflectivity; sandwiched QW; self-mixing modulation; sensing applications; standard laser rate equations; wavelength 970 nm; Interference; Laser feedback; Mirrors; Optical feedback; Optical interferometry; Optical modulation; Power lasers; Reflectivity; Surface emitting lasers; Vertical cavity surface emitting lasers;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on

Conference_Location

Munich

Print_ISBN

978-1-4244-4079-5

Electronic_ISBN

978-1-4244-4080-1

Type

conf

DOI

10.1109/CLEOE-EQEC.2009.5192873

Filename

5192873