• DocumentCode
    2800650
  • Title

    Reducing structural bias in technology mapping

  • Author

    Chatterjee, S. ; Mishchenko, A. ; Brayton, R. ; Wang, X. ; Kam, T.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci.,, UC Berkeley, CA, USA
  • fYear
    2005
  • fDate
    6-10 Nov. 2005
  • Firstpage
    519
  • Lastpage
    526
  • Abstract
    Technology mapping based on DAG-covering suffers from the problem of structural bias: the structure of the mapped netlist depends strongly on the subject graph. In this paper we present a new mapper aimed at mitigating structural bias. It is based on a simplified cut-based Boolean matching algorithm, and using the speed afforded by this simplification we explore two ideas to reduce structural bias. The first, called lossless synthesis, leverages recent advances in structure-based combinational equivalence checking to combine the different networks seen during technology independent synthesis into a single network with choices in a scalable manner. We show how cut based mapping extends naturally to handle such networks with choices. The second idea is to combine several library gates into a single gate (called a supergate) in order to make the matching process less local. We show how supergates help address the structural bias problem, and how they fit naturally into the cut-based Boolean matching scheme. An implementation based on these ideas significantly outperforms state-of-the-art mappers in terms of delay, area and run-time on academic and industrial benchmarks.
  • Keywords
    Boolean functions; logic design; logic gates; logic simulation; combinational equivalence; cut-based Boolean matching; cut-based mapping; library gates; lossless synthesis; structural bias reduction; technology mapping; Boolean functions; Delay; Electrical capacitance tomography; Libraries; Logic; Network synthesis; Proposals; Runtime;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 2005. ICCAD-2005. IEEE/ACM International Conference on
  • Print_ISBN
    0-7803-9254-X
  • Type

    conf

  • DOI
    10.1109/ICCAD.2005.1560122
  • Filename
    1560122