• DocumentCode
    280122
  • Title

    Evaluation of large area die attach using acoustic microscopy

  • Author

    Howard, A.M.

  • Author_Institution
    Plessey Res. Caswell Ltd., Towcester, UK
  • fYear
    1990
  • fDate
    33023
  • Firstpage
    42430
  • Abstract
    The technique chosen at Caswell for the analysis of die-bonds is acoustic microscopy. This is a reflection rather than transmission based technique, and has been used successfully for the nondestructive analysis of die-bonds up to 15 mm square. In this presentation, comparisons will be made between acoustic microscopy and other die-attach evaluation techniques. Examples will be shown of the way in which acoustic microscopy is used for bond evaluation and other assembly related activities
  • Keywords
    acoustic microscopy; integrated circuit testing; nondestructive testing; Caswell; acoustic microscopy; assembly related activities; bond evaluation; die-bonds; large area die attach; nondestructive analysis; reflection-based technique;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    NDT Evaluation of Electronic Components and Assemblies, IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • Filename
    190281