• DocumentCode
    2801381
  • Title

    Mechanisms for total dose sensitivity to preirradiation thermal stress in bipolar linear microcircuits

  • Author

    Pease, Ronald L. ; Shaneyfelt, Marty ; Winokur, Peter ; Fleetwood, Dan ; Gorelick, Jerry ; McClure, Steve ; Clark, Steve ; Cohn, Lew ; Alexander, Dave

  • Author_Institution
    RLP Res., Albuquerque, NM, USA
  • fYear
    1997
  • fDate
    15-19 Sep 1997
  • Firstpage
    206
  • Lastpage
    211
  • Abstract
    The ionizing radiation response of several semiconductor process technologies has been shown to be affected by preirradiation thermal stress. Data on bipolar linear circuits are presented and discussed in terms of the mechanisms previously proposed for CMOS
  • Keywords
    bipolar analogue integrated circuits; gamma-ray effects; thermal stresses; bipolar linear microcircuit; ionizing radiation response; preirradiation thermal stress; semiconductor process technology; total dose sensitivity; CMOS technology; Ceramics; Laboratories; MOSFETs; Plastic packaging; Radiation hardening; Space technology; Temperature; Thermal stresses; Weapons;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems, 1997. RADECS 97. Fourth European Conference on
  • Conference_Location
    Cannes
  • Print_ISBN
    0-7803-4071-X
  • Type

    conf

  • DOI
    10.1109/RADECS.1997.698890
  • Filename
    698890
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2801381