Title :
A 3D stackable Carbon Nanotube-based nonvolatile memory (NRAM)
Author :
Kianian, Sohrab ; Rosendale, Glen ; Manning, Monte ; Hamilton, Darlene ; Huang, X. M Henry ; Robinson, Karl ; Kim, Young Weon ; Rueckes, Thomas
Author_Institution :
Nantero Inc., Woburn, MA, USA
Abstract :
A 4 Mbit nonvolatile memory with a Carbon Nanotube (CNT) storage element has been manufactured in a 0.25 μm CMOS process at a production fab. The CNT storage element is integrated in BEOL, requires minimal additional processing steps, and only a single additional mask. The memory can be RESET in 50 nanoseconds and SET in 500 nanoseconds. Demonstrated read access time of the development vehicle is 50 nanoseconds. Write endurance is in excess of 10,000 cycles, and robust data retention has been demonstrated. The CNT storage element is scalable to <; 5 nm, and voltage and current consumption during write operations are low. As intrinsic NRAM SET & RESET times are <; 1 nanosecond, improvements in performance are anticipated.
Keywords :
CMOS memory circuits; carbon nanotubes; random-access storage; 3D stackable carbon nanotube-based nonvolatile memory; BEOL; CMOS process; CNT storage element; NRAM; size 0.25 mum; time 50 ns; time 500 ns; word length 4000 bit; Chemical elements; Current measurement; Electrodes; Junctions; Metals; Nonvolatile memory; Resistance;
Conference_Titel :
Solid-State Device Research Conference (ESSDERC), 2010 Proceedings of the European
Conference_Location :
Sevilla
Print_ISBN :
978-1-4244-6658-0
DOI :
10.1109/ESSDERC.2010.5618198