• DocumentCode
    2801489
  • Title

    A 3D stackable Carbon Nanotube-based nonvolatile memory (NRAM)

  • Author

    Kianian, Sohrab ; Rosendale, Glen ; Manning, Monte ; Hamilton, Darlene ; Huang, X. M Henry ; Robinson, Karl ; Kim, Young Weon ; Rueckes, Thomas

  • Author_Institution
    Nantero Inc., Woburn, MA, USA
  • fYear
    2010
  • fDate
    14-16 Sept. 2010
  • Firstpage
    404
  • Lastpage
    407
  • Abstract
    A 4 Mbit nonvolatile memory with a Carbon Nanotube (CNT) storage element has been manufactured in a 0.25 μm CMOS process at a production fab. The CNT storage element is integrated in BEOL, requires minimal additional processing steps, and only a single additional mask. The memory can be RESET in 50 nanoseconds and SET in 500 nanoseconds. Demonstrated read access time of the development vehicle is 50 nanoseconds. Write endurance is in excess of 10,000 cycles, and robust data retention has been demonstrated. The CNT storage element is scalable to <; 5 nm, and voltage and current consumption during write operations are low. As intrinsic NRAM SET & RESET times are <; 1 nanosecond, improvements in performance are anticipated.
  • Keywords
    CMOS memory circuits; carbon nanotubes; random-access storage; 3D stackable carbon nanotube-based nonvolatile memory; BEOL; CMOS process; CNT storage element; NRAM; size 0.25 mum; time 50 ns; time 500 ns; word length 4000 bit; Chemical elements; Current measurement; Electrodes; Junctions; Metals; Nonvolatile memory; Resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference (ESSDERC), 2010 Proceedings of the European
  • Conference_Location
    Sevilla
  • ISSN
    1930-8876
  • Print_ISBN
    978-1-4244-6658-0
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2010.5618198
  • Filename
    5618198