Title :
An efficient method for terminal reduction of interconnect circuits considering delay variations
Author :
Liu, Pu ; Tan, Sheldon X D ; Li, Hang ; Qi, Zhenyu ; Kong, Jun ; McGaughy, Bruce ; He, Lei
Author_Institution :
Dept. of Electr. Eng., California Univ., Riverside, CA, USA
Abstract :
This paper proposes a novel method to efficiently reduce the terminal number of general linear interconnect circuits with a large number of input and/or output terminals considering delay variations. Our new algorithm is motivated by the fact that VLSI interconnect circuits have many similar terminals in terms of their timing and delay metrics due to their closeness in structure or due to mathematic approximation using meshing in finite difference or finite element scheme during the extraction process. By allowing some delay tolerance or variations, we can reduce many similar terminals and keep a small number of representative terminals. After terminal reduction, traditional model order reduction methods can achieve more compact models and improve simulation efficiency. The new method, TermMerg, is based on the moments of the circuits as the metrics for the timing or delay. It then employs singular value decomposition (SVD) method to determine the optimum number of clusters based on the low-rank approximation. After this, the K-means clustering algorithm is used to cluster the moments of the terminals into different clusters. Experimental results on a number of real industry interconnect circuits demonstrate the effectiveness of the proposed method.
Keywords :
delays; finite difference methods; finite element analysis; integrated circuit interconnections; integrated circuit modelling; singular value decomposition; timing; K-means clustering algorithm; VLSI interconnect circuits; delay metrics; delay tolerance; delay variations; extraction process; finite difference scheme; finite element scheme; linear interconnect circuits; low-rank approximation; model order reduction methods; singular value decomposition method; terminal reduction; timing metrics; Approximation algorithms; Circuit simulation; Delay; Finite difference methods; Finite element methods; Integrated circuit interconnections; Mathematics; Singular value decomposition; Timing; Very large scale integration;
Conference_Titel :
Computer-Aided Design, 2005. ICCAD-2005. IEEE/ACM International Conference on
Print_ISBN :
0-7803-9254-X
DOI :
10.1109/ICCAD.2005.1560176