• DocumentCode
    2801580
  • Title

    A unified framework for statistical timing analysis with coupling and multiple input switching

  • Author

    Sinha, Debjit ; Zhou, Hai

  • Author_Institution
    Dept. of Electr. & Comput. Eng.,, Northwestern Univ., Evanston, IL, USA
  • fYear
    2005
  • fDate
    6-10 Nov. 2005
  • Firstpage
    837
  • Lastpage
    843
  • Abstract
    As technology scales to smaller dimensions, increasing process variations, coupling induced delay variations and multiple input switching effects make timing verification extremely challenging. In this paper, we establish a theoretical framework for statistical timing analysis with coupling and multiple input switching. We prove the convergence of our proposed iterative approach and discuss implementation issues under the assumption of a Gaussian distribution for the parameters of variation. A statistical timer based on our proposed approach is developed and experimental results are presented for the IS-CAS benchmarks. We juxtapose our timer with a single pass, non iterative statistical timer that does not consider the mutual dependence of coupling with timing and another statistical timer that handles coupling deterministically. Monte Carlo simulations reveal a distinct gain (up to 24%) in accuracy by our approach in comparison to the others mentioned.
  • Keywords
    Gaussian distribution; Monte Carlo methods; delays; integrated circuit modelling; iterative methods; switching; timing; Gaussian distribution; IS-CAS benchmarks; Monte Carlo simulations; coupling induced delay variations; iterative approach; multiple input switching; noniterative statistical timer; process variations; statistical timing analysis; timing verification; Coupling circuits; Delay; Electrical capacitance tomography; Gaussian distribution; Iterative methods; Mutual coupling; Switching circuits; Timing; Uncertainty; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 2005. ICCAD-2005. IEEE/ACM International Conference on
  • Print_ISBN
    0-7803-9254-X
  • Type

    conf

  • DOI
    10.1109/ICCAD.2005.1560179
  • Filename
    1560179