Title : 
A unified framework for statistical timing analysis with coupling and multiple input switching
         
        
            Author : 
Sinha, Debjit ; Zhou, Hai
         
        
            Author_Institution : 
Dept. of Electr. & Comput. Eng.,, Northwestern Univ., Evanston, IL, USA
         
        
        
        
        
        
            Abstract : 
As technology scales to smaller dimensions, increasing process variations, coupling induced delay variations and multiple input switching effects make timing verification extremely challenging. In this paper, we establish a theoretical framework for statistical timing analysis with coupling and multiple input switching. We prove the convergence of our proposed iterative approach and discuss implementation issues under the assumption of a Gaussian distribution for the parameters of variation. A statistical timer based on our proposed approach is developed and experimental results are presented for the IS-CAS benchmarks. We juxtapose our timer with a single pass, non iterative statistical timer that does not consider the mutual dependence of coupling with timing and another statistical timer that handles coupling deterministically. Monte Carlo simulations reveal a distinct gain (up to 24%) in accuracy by our approach in comparison to the others mentioned.
         
        
            Keywords : 
Gaussian distribution; Monte Carlo methods; delays; integrated circuit modelling; iterative methods; switching; timing; Gaussian distribution; IS-CAS benchmarks; Monte Carlo simulations; coupling induced delay variations; iterative approach; multiple input switching; noniterative statistical timer; process variations; statistical timing analysis; timing verification; Coupling circuits; Delay; Electrical capacitance tomography; Gaussian distribution; Iterative methods; Mutual coupling; Switching circuits; Timing; Uncertainty; Wires;
         
        
        
        
            Conference_Titel : 
Computer-Aided Design, 2005. ICCAD-2005. IEEE/ACM International Conference on
         
        
            Print_ISBN : 
0-7803-9254-X
         
        
        
            DOI : 
10.1109/ICCAD.2005.1560179