• DocumentCode
    2802041
  • Title

    Edge currents on metal strip gratings

  • Author

    Shiao, C.M. ; Peng, S.T.

  • Author_Institution
    Dept. of Commun. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • Volume
    4
  • fYear
    1997
  • fDate
    13-18 July 1997
  • Firstpage
    2404
  • Abstract
    We present a rigorous analysis of current distribution induced on metal strip grating by an incident plane wave. The grating is characterized by a complex permittivity, with a large imaginary part to account for the finite conductivity of the metal strips. Such a scattering problem is formulated by the method of mode matching to determine the scattered fields everywhere, so that the volume distribution of the current within a metal strip can be explicitly obtained. In particular, in the case of TE-mode incidence, edge currents on the metal strips are examined, with respect to the conductivity and thickness of the grating as well as the incident wavelength. Our results agree well with those of the quasi-static approximation in the low-frequency limit, while noticeable deviations are observed in the high-frequency end.
  • Keywords
    current distribution; diffraction gratings; electrical conductivity; electromagnetic fields; electromagnetic induction; electromagnetic wave scattering; mode matching; permittivity; waveguide theory; waveguides; TE-mode incidence; complex permittivity; edge currents; finite conductivity; grating thickness; high-frequency limit; incident plane wave; incident wavelength; induced current distribution; low-frequency limit; metal strip gratings; mode matching method; parallel plate waveguides; quasi-static approximation; scattered fields; scattering problem; volume distribution; Conductivity; Coplanar waveguides; Current distribution; Gratings; Integral equations; Microstrip; Permittivity; Scattering; Strips; Transmission lines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1997. IEEE., 1997 Digest
  • Conference_Location
    Montreal, Quebec, Canada
  • Print_ISBN
    0-7803-4178-3
  • Type

    conf

  • DOI
    10.1109/APS.1997.625455
  • Filename
    625455