Title :
The determination of far field antenna patterns using Fresnel probe measurements
Author :
Mitchell, F.H., Jr. ; Coffin, R.T. ; Hefner, W.H.
Author_Institution :
IBM Corporation, Huntsville, AL, USA
Keywords :
Antenna measurements; Antennas and propagation; Dipole antennas; Extraterrestrial measurements; Feeds; Lenses; Microwave antennas; Microwave measurements; Probes; System testing;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1968
DOI :
10.1109/APS.1968.1150671