Title :
Specification capture and yield enhancement in an interactive environment
Author :
De Boer, Rik ; Jennings, Paul ; Rankin, Paul
Author_Institution :
Interactive Solutions Ltd., London, UK
Abstract :
Describes a new tool for the analogue circuit designer, a tool concerned particularly with component tolerances and the unwanted effect these have on the performance of a mass-produced circuit. It assists in the redesign of a circuit to increase the manufacturing yield and reduce component costs. Like some conventional tools, this one simulates the effect of component variations on circuit performance and, by checking against performance specifications, estimates the manufacturing yield. Unlike others, however, it not only provides the designer with diagnostic information regarding especially sensitive parameters and specifications, but will also automatically adjust the nominal values of components in order to maximise the yield. Any parameter, such as the width of a device or the value of a resistor, may be designated as adjustable by the designer
Keywords :
analogue circuits; circuit CAD; interactive systems; analogue circuit designer; circuit performance; component tolerances; diagnostic information; interactive environment; manufacturing yield; mass-produced circuit; nominal values; yield enhancement;
Conference_Titel :
Analogue IC Design: Obstacles and Opportunities, IEE Colloquium on
Conference_Location :
London