DocumentCode :
2802248
Title :
Experimental comparison of the radiation efficiency for conventional and cavity backed microstrip antennas
Author :
Duffy, S.M. ; Gouker, M.A.
Author_Institution :
Lincoln Lab., MIT, Lexington, MA, USA
Volume :
1
fYear :
1996
fDate :
21-26 July 1996
Firstpage :
196
Abstract :
The radiation efficiency of conventional microstrip antennas generally decreases when the substrate thickness or permittivity is increased because of loss to surface waves. However, constructing a metal cavity around the microstrip antenna prevents the surface wave propagation. Thus, the cavity backed microstrip antenna has been predicted to have increased radiation efficiency (Zavosh and Aberle 1995). In this paper, we compare conventional and cavity backed microstrip patch antennas on substrates with an electrical thickness of 0.067 /spl lambda//sub 0/ and dielectric constants of /spl epsi/r=2.94, 6.15, and 10.2. As one would expect, the radiation efficiency of the conventional patch decreases with increasing dielectric constant, but the efficiency remains relatively constant for the cavity backed patch. In this work, three different methods are used to measure the radiation efficiencies: a far field gain comparison, a Wheeler cap method and an input admittance method.
Keywords :
antenna radiation patterns; antenna testing; electric admittance; microstrip antennas; permittivity; Wheeler cap method; cavity backed microstrip antennas; dielectric constants; efficiency; far field gain comparison; input admittance method; metal cavity; microstrip patch antennas; permittivity; radiation efficiency; substrate thickness; surface wave propagation; Admittance measurement; Antennas and propagation; Dielectric constant; Dielectric measurements; Dielectric substrates; Gain measurement; Microstrip antennas; Patch antennas; Permittivity; Surface waves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 1996. AP-S. Digest
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-3216-4
Type :
conf
DOI :
10.1109/APS.1996.549574
Filename :
549574
Link To Document :
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