DocumentCode
2802248
Title
Experimental comparison of the radiation efficiency for conventional and cavity backed microstrip antennas
Author
Duffy, S.M. ; Gouker, M.A.
Author_Institution
Lincoln Lab., MIT, Lexington, MA, USA
Volume
1
fYear
1996
fDate
21-26 July 1996
Firstpage
196
Abstract
The radiation efficiency of conventional microstrip antennas generally decreases when the substrate thickness or permittivity is increased because of loss to surface waves. However, constructing a metal cavity around the microstrip antenna prevents the surface wave propagation. Thus, the cavity backed microstrip antenna has been predicted to have increased radiation efficiency (Zavosh and Aberle 1995). In this paper, we compare conventional and cavity backed microstrip patch antennas on substrates with an electrical thickness of 0.067 /spl lambda//sub 0/ and dielectric constants of /spl epsi/r=2.94, 6.15, and 10.2. As one would expect, the radiation efficiency of the conventional patch decreases with increasing dielectric constant, but the efficiency remains relatively constant for the cavity backed patch. In this work, three different methods are used to measure the radiation efficiencies: a far field gain comparison, a Wheeler cap method and an input admittance method.
Keywords
antenna radiation patterns; antenna testing; electric admittance; microstrip antennas; permittivity; Wheeler cap method; cavity backed microstrip antennas; dielectric constants; efficiency; far field gain comparison; input admittance method; metal cavity; microstrip patch antennas; permittivity; radiation efficiency; substrate thickness; surface wave propagation; Admittance measurement; Antennas and propagation; Dielectric constant; Dielectric measurements; Dielectric substrates; Gain measurement; Microstrip antennas; Patch antennas; Permittivity; Surface waves;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 1996. AP-S. Digest
Conference_Location
Baltimore, MD, USA
Print_ISBN
0-7803-3216-4
Type
conf
DOI
10.1109/APS.1996.549574
Filename
549574
Link To Document