• DocumentCode
    2802248
  • Title

    Experimental comparison of the radiation efficiency for conventional and cavity backed microstrip antennas

  • Author

    Duffy, S.M. ; Gouker, M.A.

  • Author_Institution
    Lincoln Lab., MIT, Lexington, MA, USA
  • Volume
    1
  • fYear
    1996
  • fDate
    21-26 July 1996
  • Firstpage
    196
  • Abstract
    The radiation efficiency of conventional microstrip antennas generally decreases when the substrate thickness or permittivity is increased because of loss to surface waves. However, constructing a metal cavity around the microstrip antenna prevents the surface wave propagation. Thus, the cavity backed microstrip antenna has been predicted to have increased radiation efficiency (Zavosh and Aberle 1995). In this paper, we compare conventional and cavity backed microstrip patch antennas on substrates with an electrical thickness of 0.067 /spl lambda//sub 0/ and dielectric constants of /spl epsi/r=2.94, 6.15, and 10.2. As one would expect, the radiation efficiency of the conventional patch decreases with increasing dielectric constant, but the efficiency remains relatively constant for the cavity backed patch. In this work, three different methods are used to measure the radiation efficiencies: a far field gain comparison, a Wheeler cap method and an input admittance method.
  • Keywords
    antenna radiation patterns; antenna testing; electric admittance; microstrip antennas; permittivity; Wheeler cap method; cavity backed microstrip antennas; dielectric constants; efficiency; far field gain comparison; input admittance method; metal cavity; microstrip patch antennas; permittivity; radiation efficiency; substrate thickness; surface wave propagation; Admittance measurement; Antennas and propagation; Dielectric constant; Dielectric measurements; Dielectric substrates; Gain measurement; Microstrip antennas; Patch antennas; Permittivity; Surface waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1996. AP-S. Digest
  • Conference_Location
    Baltimore, MD, USA
  • Print_ISBN
    0-7803-3216-4
  • Type

    conf

  • DOI
    10.1109/APS.1996.549574
  • Filename
    549574