DocumentCode :
2802376
Title :
Using a thermal simulation model to interpret test data [air cooling of circuit boards]
Author :
Azar, Kaveh ; Manno, Vincent P.
Author_Institution :
AT&T Bell Lab., North Andover, MA, USA
fYear :
1992
fDate :
3-5 Feb 1992
Firstpage :
4
Lastpage :
10
Abstract :
The concurrent utilization of testing and simulation models is advocated as a means of improving the thermal characterization process. One such model based upon a combination of integral energy and momentum balances and local thermal networks is described. The general process of data interpretation using a simulation model is outlined as a series of guidelines. The process is illustrated through a series of tests involving air-cooling of boards with regular and irregular component layouts. Specific sensitivities tested included component powering, component height, and arrangement heterogeneity. The treatments of the convective heat transfer coefficient and the flow split among component flow channels were found to be the most important sensitivities in these tests. Using simulation models is considered to reduce uncertainties in estimating adiabatic heat transfer correlations. Recommendations and guidance are provided for an innovative approach to thermal characterization using existing technology
Keywords :
convection; cooling; packaging; printed circuit design; printed circuit testing; thermal analysis; adiabatic heat transfer correlations; air-cooling; arrangement heterogeneity; component flow channels; component height; component powering; convective heat transfer coefficient; energy balance; local thermal networks; momentum balances; parallel mounted circuit boards; test data interpretation; thermal characterization; thermal simulation model; Circuit simulation; Circuit testing; Cooling; Heat transfer; Pressure control; Printed circuits; Temperature control; Thickness control; Velocity control; Weight control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 1992. SEMI-THERM VIII., Eighth Annual IEEE
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-0500-0
Type :
conf
DOI :
10.1109/STHERM.1992.172845
Filename :
172845
Link To Document :
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