• DocumentCode
    2802437
  • Title

    Simulation schemes in 2D nanoscale MOSFET´s: WKB based method

  • Author

    Ben Abdallah, N. ; Negulescu, C. ; Mouis, M. ; Polizzi, E.

  • Author_Institution
    Mathematiques pour l´´Ind. et la Phys., Univ. Paul Sabatier, Toulouse, France
  • fYear
    2004
  • fDate
    24-27 Oct. 2004
  • Firstpage
    211
  • Lastpage
    212
  • Abstract
    We present; a numerical method to simulate quantum transport in silicon ultrashort channel MOSFET (DGFET). The considered model is ballistic rind consists in solving Schrodinger equations with quantum transmitting boundary conditions, coupled to the Poisson equation for the electrostatic potential. There is an enormous amount of work dedicated to numerical solution of Schrodinger-Poisson systems (with open boundary conditions) either by finite element/difference methods or Green´s function techniques. Our work, which is based on finite element approximation, reduces the number of grid points in order to lower the computational cost, while keeping a good accuracy.
  • Keywords
    Green´s function methods; MOSFET; Poisson equation; Schrodinger equation; WKB calculations; circuit complexity; electronic engineering computing; electrostatics; finite difference methods; finite element analysis; nanoelectronics; semiconductor device models; 2D nanoscale MOSFET; DGFET; Greens function techniques; Poisson equation; Schrodinger equations; Schrodinger-Poisson systems; WKB based method; ballistic rind; electrostatic potential; finite difference methods; finite element approximation; finite element methods; numerical method; open boundary conditions; quantum transmitting boundary conditions; quantum transport simulation; silicon ultrashort channel; Electrostatic analysis; Finite difference methods; Finite element methods; Green function; MOSFETs; Partial differential equations; Quantum theory; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Electronics, 2004. IWCE-10 2004. Abstracts. 10th International Workshop on
  • Conference_Location
    West Lafayette, IN, USA
  • Print_ISBN
    0-7803-8649-3
  • Type

    conf

  • DOI
    10.1109/IWCE.2004.1407401
  • Filename
    1407401