• DocumentCode
    2802483
  • Title

    Simulation of electrothermal interactions in power integrated circuits

  • Author

    Hebrard, Luc ; Jacquemod, Gilles ; Boutherin, Bernard ; Le Helley, Michel

  • Author_Institution
    Lab. d´´Electron. d´´Autom. et de Mesures Electr., Ecole Centrale de Lyon, Ecully, France
  • fYear
    1992
  • fDate
    3-5 Feb 1992
  • Firstpage
    76
  • Lastpage
    82
  • Abstract
    The authors present SETIPIC, a software package which couples electric and thermal simulations to forecast the electrothermal interactions in the first design steps of power integrated circuits. To give a consistent interface to the designer, SETIPIC is integrated in the EDGE CAD system PICMOST, the thermal simulator used by SETIPIC to obtain the thermal distribution on the layout surface in a transient or stationary mode, is also described. It takes into account the chip environment by the connection of different thermal networks, and uses an automatic mesh method to handle the layout configurations. An infrared experimental method is described to characterize the thermal distribution on a chip. This system was used to validate PICMOST. Some simulation results are given
  • Keywords
    circuit CAD; circuit analysis computing; power integrated circuits; software packages; temperature distribution; thermal analysis; EDGE CAD system; PICMOST; SETIPIC; automatic mesh method; electric simulation; electrothermal interactions; infrared experimental method; layout surface; power integrated circuits; software package; stationary mode; thermal distribution; thermal simulations; transient mode; Circuit simulation; Circuit stability; Coupling circuits; Design automation; Electric variables; Electrothermal effects; Packaging; Power integrated circuits; Predictive models; Stability analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 1992. SEMI-THERM VIII., Eighth Annual IEEE
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-0500-0
  • Type

    conf

  • DOI
    10.1109/STHERM.1992.172854
  • Filename
    172854