Title :
Thermal performance of power packages-single-inline package as a case study
Author :
Chambers, Ben ; Mahilingam, M.
Author_Institution :
Motorola Inc., Phoenix, AZ, USA
Abstract :
The authors focus on the experimental results obtained from thermal resistance measurements made on 23 lead single-in-line (SIP-23) power packages. The experimental techniques employed in making the measurements are reviewed followed by a presentation of the experimental results. A generalized discussion is included of the effects of the various parameters on the package´s thermal performance. These results are compared to other similar power packages such as the TO-218 and TO-220 discrete device packages. Some simple empirical models which may be of value to system designers are included
Keywords :
packaging; power integrated circuits; thermal resistance; SIP-23; empirical models; single in line power packages; smart power; thermal performance; thermal resistance; Clamps; Computer aided software engineering; Electrical resistance measurement; Force measurement; Manufacturing processes; Plastic packaging; Resistance heating; Semiconductor device packaging; Thermal force; Thermal resistance;
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 1992. SEMI-THERM VIII., Eighth Annual IEEE
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-0500-0
DOI :
10.1109/STHERM.1992.172855