Title :
Spectral element method for the Schrodinger-Poisson system
Author :
Candong Cheng ; Qing Huo Liu ; Massoud, H.Z.
Author_Institution :
Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
Abstract :
A novel fast spectral element method (SEM) with exponential accuracy for the self-consistent solution of the Schrodinger-Poisson system has been developed for the simulation of semiconductor nanodevices. Gauss-Lobatto-Legendre polynomials were used to represent the unknown fields in the Schrodinger and Poisson equations. The model allows arbitrary potential energy and charge distributions. The predictor-corrector algorithm is applied to solve the outer loop of the self-consistent iteration. The nonlinear Poisson equation is solved by Newton´s method to increase the efficiency of the system. In this paper, the spectral element method is first applied on an infinite quantum well under an external bias to solve the Schrodinger equation. Numerical results confirm the spectral accuracy of this method. The method can achieve high accuracy with a low sampling density, thus significantly lowering the computer memory and computational time compared to conventional methods.
Keywords :
Legendre polynomials; MOSFET; Newton method; Poisson equation; Schrodinger equation; finite element analysis; nanoelectronics; potential energy functions; predictor-corrector methods; quantum well devices; semiconductor device models; Gauss-Lobatto-Legendre polynomials; MOSFET; Newton method; Schrodinger equation; Schrodinger-Poisson system; charge distributions; infinite quantum well; nonlinear Poisson equation; potential energy; predictor-corrector algorithm; self-consistent iteration; self-consistent solution; semiconductor nanodevice simulation; spectral element method; Finite element methods; MOSFETs; Newton method; Partial differential equations; Quantum theory; Semiconductor device modeling;
Conference_Titel :
Computational Electronics, 2004. IWCE-10 2004. Abstracts. 10th International Workshop on
Conference_Location :
West Lafayette, IN, USA
Print_ISBN :
0-7803-8649-3
DOI :
10.1109/IWCE.2004.1407406