DocumentCode :
280260
Title :
The validation of nonlinear FET modelling and circuit simulation
Author :
Davis, R.G. ; Gaskell, J.M. ; Ball, G. ; Allenson, M.B.
Author_Institution :
DP2 Div., R. Signals & Radar Establ., Malvern, UK
fYear :
1990
fDate :
33049
Firstpage :
42401
Lastpage :
42404
Abstract :
There are strong economic arguments for a `right first time´ design method for nonlinear GaAs FET based MMICs and MICs. With this aim the authors have successfully implemented a lookup table method of MESFET representation in conjunction with the time domain simulator ASTEC3. This has been used to model the gate and drain current generators and can also be applied to the voltage dependence of the equivalent circuit reactances. It removes inaccuracy which can occur with algebraic functional forms and allows a clearer assessment of the underlying modelling and simulation processes. It also allows alternative device types to be examined without the often difficult and time consuming development of functional forms to adequately represent each type. Circuit measurement at 100 MHz has been used to verify the accuracy of current generators based on DC characteristics. There are discrepancies between measured and simulated power saturation plots of 0.5 and 2.5 db. Since this can occur in both linear and nonlinear regions it is likely that dispersion due to surface and interface states is having an effect
Keywords :
MMIC; Schottky gate field effect transistors; circuit analysis computing; equivalent circuits; microwave integrated circuits; semiconductor device models; solid-state microwave devices; table lookup; 100 MHz; ASTEC3; DC characteristics; GaAs; MESFET; MICs; MMICs; circuit simulation; drain current generators; equivalent circuit reactances; gate current generator; interface states; lookup table method; microwave transistors; nonlinear FET modelling; surface states; time domain simulator; voltage dependence;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Non-Linear Modelling of Microwave Devices and Circuits, IEE Colloquium on
Conference_Location :
London
Type :
conf
Filename :
190474
Link To Document :
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