DocumentCode
280264
Title
Analysis of potential high power failure in millimetric Schottky barrier diodes
Author
Blakelock, P.A. ; Seager, R.D.
Author_Institution
MEDL Microwave, Lincoln, UK
fYear
1990
fDate
33049
Firstpage
42522
Abstract
An experimental and theoretical study has been made of the characteristics, performance, and limitations of a Schottky barrier diode operating as a power sampler at 35 GHz. The Schottky diode is used to rectify incident power at 35 GHz, the resulting DC current is used to pre-bias a waveguide mounted PIN diode into a low impedance, high attenuation state. The diode junction is frequently subjected to comparatively high levels of incident RF power and for a variety of reasons it is important to know how the diode responds in this environment. For instance, the designer needs to know what is the maximum, worst case, safe power level that the device can withstand. Equally, it is important to know whether the diode, together with its associated microwave circuitry, will respond quickly enough at the onset of incident power, which factors will affect conversion efficiency, and likely performance at higher frequencies, notably 60 GHz and 94 GHz
Keywords
Schottky-barrier diodes; equivalent circuits; failure analysis; reliability; semiconductor device models; semiconductor device testing; solid-state microwave devices; solid-state rectifiers; 35 GHz; 60 GHz; 94 GHz; DC current; EHF; MM-wave device; conversion efficiency; high power failure; incident RF power; millimetric Schottky barrier diodes; power sampler; response time; safe power level; waveguide mounted PIN diode;
fLanguage
English
Publisher
iet
Conference_Titel
Non-Linear Modelling of Microwave Devices and Circuits, IEE Colloquium on
Conference_Location
London
Type
conf
Filename
190478
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