DocumentCode :
2802736
Title :
Digital Image Watermarking Using Bidimensional Empirical Mode Decomposition in Wavelet Domain
Author :
Lee, Youngseock ; Nah, Jihah ; Kim, JongWeon
Author_Institution :
Chungwoon Univ., Chungnam, South Korea
fYear :
2009
fDate :
14-16 Dec. 2009
Firstpage :
583
Lastpage :
588
Abstract :
In this paper a blind watermarking algorithm for digital image is presented. The proposed method operates in wavelet domain. The watermark is decomposed into 2D-IMFs(intrinsic mode functions)using BEMD (bidimensional empirical mode decomposition) which is the 2-dimensional extension of 1 dimensional empirical mode decomposition. The CDMA (code division multiple access) SS (spread spectrum) technique is applied to watermark imbedding and detection process. In watermark embedding process the each IMF of watermark is embed middle frequency subimages in wavelet domain, so subimages just include partial information about embedded watermark. By characteristics of BEMD, when the partial information of watermark is synthesized, the original watermark is reconstructed. The experimental results show that the proposed watermarking algorithm is in almost invisible difference between original image and watermarked image and moreover is robust against JPEG compression, common image processing distortions.
Keywords :
image coding; watermarking; wavelet transforms; 1D empirical mode decomposition; JPEG compression; bidimensional empirical mode decomposition; blind watermarking algorithm; code division multiple access spread spectrum; digital image watermarking; image processing distortion; intrinsic mode function; watermark embedding process; wavelet domain; Digital images; Frequency; Image coding; Image reconstruction; Multiaccess communication; Robustness; Spread spectrum communication; Transform coding; Watermarking; Wavelet domain; BEMD; CDMA; watermarking; wavelet;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multimedia, 2009. ISM '09. 11th IEEE International Symposium on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-5231-6
Electronic_ISBN :
978-0-7695-3890-7
Type :
conf
DOI :
10.1109/ISM.2009.48
Filename :
5362510
Link To Document :
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