DocumentCode :
2802738
Title :
Reliability consideration for advanced microelectronics
Author :
Kayali, Sammy
Author_Institution :
California Institute of Technology
fYear :
2000
fDate :
2000
Firstpage :
99
Lastpage :
99
Keywords :
Microelectronics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Dependable Computing, 2000. Proceedings. 2000 Pacific Rim International Symposium on
Print_ISBN :
0-7695-0975-4
Type :
conf
DOI :
10.1109/PRDC.2000.897290
Filename :
897290
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2802738
