Title :
Neutron induced damage in linear integrated circuits: Ionizing effects contribution
Author :
Azaïs, B. ; Lopez, D. ; Vie, M.
Author_Institution :
Centre d´´Etudes de Gramat, France
Abstract :
This work deals with the impact of ionizing dose induced damage in linear junction isolated integrated circuits (JIICs) when exposed to neutron irradiations. A very low contribution of ionizing effects is shown for standard neutron test conditions
Keywords :
analogue integrated circuits; isolation technology; neutron effects; ionizing dose; linear junction isolated integrated circuit; neutron irradiation damage; Analog integrated circuits; Atomic measurements; Fission reactors; Fusion power generation; Inductors; Ion accelerators; Ionization; Neutrons; Silicon compounds; Testing;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 1997. RADECS 97. Fourth European Conference on
Conference_Location :
Cannes
Print_ISBN :
0-7803-4071-X
DOI :
10.1109/RADECS.1997.698898
