DocumentCode :
2803009
Title :
Power Aware Shift and Capture ATPG Methodology for Low Power Designs
Author :
Khullar, Shray ; Bahl, Swapnil
Author_Institution :
Technol. R&D, STMicroelectron., Noida, India
fYear :
2011
fDate :
20-23 Nov. 2011
Firstpage :
500
Lastpage :
505
Abstract :
Power management has emerged as a major design objective, both in functional and test mode, in most of the application domains that employ digital ICs. This paper presents a low power ATPG methodology for managing power both in shift and capture mode. The technique exploits the embedded clock gates and provides a good tradeoff between pattern count and reduction in switching activity without any significant coverage loss. The methodology also presents a novel method of selective scan chain reordering for scan compressed designs to reduce shift switching activity with minimal design flow constraints.
Keywords :
automatic test pattern generation; digital integrated circuits; ATPG methodology; clock gates; digital IC; low power designs; minimal design flow; power aware shift; shift switching activity reduction; test mode; Automatic test pattern generation; Clocks; Correlation; Logic gates; Power demand; Switches; Vectors; capture power; low power; scan reordering; shift power;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium (ATS), 2011 20th Asian
Conference_Location :
New Delhi
ISSN :
1081-7735
Print_ISBN :
978-1-4577-1984-4
Type :
conf
DOI :
10.1109/ATS.2011.65
Filename :
6114725
Link To Document :
بازگشت