Title :
Power Aware Embedded Test
Author :
Lin, Xijiang ; Moghaddam, Elham ; Mukherjee, Nilanjan ; Nadeau-Dostie, Benoit ; Rajski, Janusz ; Tyszer, Jerzy
Author_Institution :
Mentor Graphics Corp., Wilsonville, OR, USA
Abstract :
In this paper we examine several embedded low power test schemes that we have proposed over the last few years. These solutions are aimed at reducing the switching activity during all scan-based test operations, particularly including those developed for BIST or deployed to perform on-chip test data compression.
Keywords :
built-in self test; embedded systems; integrated circuit testing; low-power electronics; power integrated circuits; BIST; low power test scheme; on-chip test data compression; power aware embedded test; scan-based test operation;
Conference_Titel :
Test Symposium (ATS), 2011 20th Asian
Conference_Location :
New Delhi
Print_ISBN :
978-1-4577-1984-4
DOI :
10.1109/ATS.2011.49
