DocumentCode :
2803064
Title :
Testability of Cryptographic Hardware and Detection of Hardware Trojans
Author :
Mukhopadhyay, Debdeep ; Chakraborty, Rajat Subhra
Author_Institution :
Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
fYear :
2011
fDate :
20-23 Nov. 2011
Firstpage :
517
Lastpage :
524
Abstract :
Cryptographic algorithms are routinely used toper form computationally intense operations over increasingly larger volumes of data, and in order to meet the high throughput requirements of the applications, are often implemented by VLSI designs. The high complexity of such implementations raises concern about their reliability. In order to improve upon the testability of sequential circuits, both at fabrication time and also in the field, Design For Testability (DFT) techniques are commonly employed. However conventional DFT methodologies for digital circuits have been found to compromise the security of the cryptographic hardware. In this tutorial we first discuss the challenges and potential attacks on cipher hardware through standard DFT techniques, and then potential solutions against them. Also, as the electronic design industry has grown globally, economic reasons dictate the widespread participation of external agents in modern design and manufacture of integrated circuits(ICs), which decreases the control that the IC design houses used to traditionally have over their own designs. This issue raises the question of ensuring Trust in an integrated circuit, and whether the IC can be certified to be free of malicious, hard-to detect circuitry, commonly referred to as Hardware Trojans. In this tutorial, we would explore the unique challenges and testing solutions to detect/prevent such malicious modifications.
Keywords :
VLSI; cryptography; design for testability; integrated circuit design; integrated circuit manufacture; integrated circuit reliability; integrated circuit testing; invasive software; sequential circuits; VLSI designs; cipher hardware; cryptographic hardware testability; design for testability; digital circuits; electronic design industry; hard-to detect circuitry; hardware trojans detection; integrated circuit design; integrated circuit manufacture; reliability; sequential circuit testability; Cryptography; Hardware; Registers; Strontium; Testing; Trojan horses; Cryptograohic hardware; VLSI; design for testability; hardware Trojans; hardware security; scan chains; side-channel analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium (ATS), 2011 20th Asian
Conference_Location :
New Delhi
ISSN :
1081-7735
Print_ISBN :
978-1-4577-1984-4
Type :
conf
DOI :
10.1109/ATS.2011.27
Filename :
6114728
Link To Document :
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