DocumentCode
2803324
Title
Algorithms for sorting and reconstructing heterogeneous nanoscale biological objects from cryo electron microscopy images
Author
Zheng, Yili ; Doerschuk, Peter C.
Author_Institution
Biomed. Eng. & Electr. & Comput. Eng., Cornell Univ., Ithaca, NY, USA
fYear
2009
fDate
June 28 2009-July 1 2009
Firstpage
169
Lastpage
172
Abstract
Statistical algorithms are described for 2- and 3-D signal reconstruction and classification problems based on electron microscopy images where the objects displayed in the images are heterogeneous. Both discrete heterogeneity (there exist classes of objects but all objects within one class are identical) and continuous heterogeneity (there exist classes of objects but, in addition, the objects within a class differ). With continuous heterogeneity, the idea of reconstruction is generalized from reconstruction of a unique 2- or 3-D object to reconstruction of the statistics of the 2- or 3-D object. The basic process is reconstruction by maximum likelihood estimation computed by an expectation-maximization algorithm with classification following as postprocessing given the reconstruction. Two examples are considered, one focusing on classification and one on reconstruction.
Keywords
biothermics; electron microscopy; expectation-maximisation algorithm; image classification; image reconstruction; medical image processing; continuous heterogeneity; cryo electron microscopy; discrete heterogeneity; expectation-maximization algorithm; heterogeneous nanoscale biological objects; maximum likelihood estimation; signal classification; signal reconstruction; statistical algorithms; Biology computing; Biomedical computing; Biomedical engineering; Electron microscopy; Image reconstruction; Nanobioscience; Portals; Scattering; Sorting; Three dimensional displays; 2-D and 3-D image reconstruction; electron microscopy; heterogeneous objects; image classification; tomography; virus;
fLanguage
English
Publisher
ieee
Conference_Titel
Biomedical Imaging: From Nano to Macro, 2009. ISBI '09. IEEE International Symposium on
Conference_Location
Boston, MA
ISSN
1945-7928
Print_ISBN
978-1-4244-3931-7
Electronic_ISBN
1945-7928
Type
conf
DOI
10.1109/ISBI.2009.5193010
Filename
5193010
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