• DocumentCode
    2803383
  • Title

    Silicon low noise amplifier chips for multi-chip module integration on a silicon-based substrate

  • Author

    Jenshan Lin ; Weiner, J.S. ; Huan-Shang Tsai ; Georgiou, G. ; Young-Kai Chen ; King L.Tai ; Lau, M.L. ; Kossives, D.P.

  • Author_Institution
    Lucent Technol., Bell Labs., Murray Hill, NJ., USA
  • fYear
    1997
  • fDate
    10-10 June 1997
  • Firstpage
    121
  • Lastpage
    125
  • Abstract
    A method of designing low noise amplifier (LNA) using multi-chip module (MCM) technology is described here. First, low noise amplifier blocks using silicon BiCMOS process were fabricated. Noise figure and gain from 2-6 GHz were measured at different bias voltages after chips were fabricated. These chips were designed for multi-chip module integration on a newly developed low cost, low loss silicon substrate on which high-Q matching inductors are fabricated. Since the electrical characteristics of passive components on MCM are well controlled and the electrical characteristics of active devices are measured after fabrication, design accuracy and high yield can be achieved. Two design examples of low noise amplifiers at 2 GHz and 5 GHz are discussed. The 2 GHz LNA design utilizes high-Q spiral inductors as matching components whereas the 5 GHz LNA design utilizes microstrip lines as matching inductors.
  • Keywords
    BiCMOS integrated circuits; MMIC amplifiers; UHF amplifiers; elemental semiconductors; flip-chip devices; impedance matching; integrated circuit packaging; microstrip lines; multichip modules; silicon; 2 to 6 GHz; BiCMOS process; Si; bias voltages; design accuracy; electrical characteristics; high-Q matching inductors; high-Q spiral inductors; low noise amplifier chips; matching components; microstrip lines; multi-chip module integration; BiCMOS integrated circuits; Design methodology; Electric variables; Gain measurement; Inductors; Low-noise amplifiers; Noise figure; Noise measurement; Semiconductor device measurement; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Frequency Integrated Circuits (RFIC) Symposium, 1997., IEEE
  • Conference_Location
    Denver, CO, USA
  • Print_ISBN
    0-7803-4063-9
  • Type

    conf

  • DOI
    10.1109/RFIC.1997.598757
  • Filename
    598757