DocumentCode :
2803393
Title :
A method for continuous accelerated echo-planar imaging with self-referenced parallel MR reconstruction and artifact correction
Author :
Hoge, W. Scott ; Tan, Huan ; Kraft, Robert A.
Author_Institution :
Dept. of Radiol., Brigham & Women´´s Hosp., Boston, MA, USA
fYear :
2009
fDate :
June 28 2009-July 1 2009
Firstpage :
189
Lastpage :
192
Abstract :
Echo planar imaging (EPI) is a widely used rapid MRI technique to image dynamic neurological functionally, but can suffer from Nyquist ghosts and distortions due to magnetic field inhomogeneity. Distortion effects can be reduced by parallel MR imaging (pMRI), via a reduced echo train length, and/or methods that measure and estimate magnetic field distortions using multiple TEs. Recent Nyquist ghost correction methods can also improve self-referenced pMRI image reconstruction quality. Here, we present a combination of these improvements in a framework for continuous echo planar imaging. Through a combination of shifted variable density EPI trajectories and alternating echo spacings, our approach can remove Nyquist ghosts, apply pMRI reconstruction, and correct off-resonant distortions with no need for additional reference data. Results from accelerated in-vivo data are presented.
Keywords :
biomedical MRI; image denoising; image enhancement; image reconstruction; medical image processing; neurophysiology; MRI; Nyquist ghost removal; artifact correction; distortion effects; dynamic neurological imaging; echo-planar imaging; image reconstruction; magnetic field inhomogeneity; parallel MR reconstruction; reduced echo train length; self-referenced MR reconstruction; Acceleration; Biomedical imaging; Calibration; Distortion measurement; High-resolution imaging; Image reconstruction; Image sampling; Magnetic field measurement; Magnetic resonance imaging; Spatial resolution; EPI Distortion Correction; EPI Nyquist Ghost Removal; Magnetic resonance imaging; Parallel MR Imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2009. ISBI '09. IEEE International Symposium on
Conference_Location :
Boston, MA
ISSN :
1945-7928
Print_ISBN :
978-1-4244-3931-7
Electronic_ISBN :
1945-7928
Type :
conf
DOI :
10.1109/ISBI.2009.5193015
Filename :
5193015
Link To Document :
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