New Fault Detection Algorithm for Multi-level Cell Flash Memroies

With a development of high-capacity flash memory, a variety of applications have been featured in the current market. Since the density per unit area of multi-level cell flash memory (MLC), is doubled compared with single level cell flash memory (SLC), the MLC is widely used in flash memory. However, it is difficult to efficiently test the MLC. In order to test the MLC with low test time and low test cost, a new test algorithm for the MLC is proposed. The performance of the proposed algorithm is better than existing algorithms.