Title :
High Level Verification and Its Use at Pos-Silicon Debugging and Patching
Author :
Fujita, Masahiro
Author_Institution :
VLSI Design & Educ. Center (VDEC), Univ. of Tokyo, Tokyo, Japan
Abstract :
In this paper, we first discuss about high level formal verification and analysis techniques targeting C-based designs. They are based on dependence traversal and analyze design descriptions locally. An equivalence checking technique based on dependence traversal of the difference between the two design descriptions is shown. Then we introduce special mechanisms called patchable accelerators, for post-silicon verification and debugging which can automatically be high level synthesized from C-based design descriptions. By using the patch logic in the synthesized accelerators, values of internal signals can be observed and controlled. With those information, a post-silicon debugging technique based on symbolic traverse of the dependency in C-based design description is developed.
Keywords :
computer debugging; elemental semiconductors; silicon; system-on-chip; C-based designs; Si; analysis techniques; equivalence checking technique; high level verification; internal signals; patchable accelerators; pos-silicon debugging; symbolic traverse; synthesized accelerators; Computer bugs; Debugging; Hardware; High level synthesis; Image edge detection; Registers; C-based design; debug; patch; post-silicon; testing; verification;
Conference_Titel :
Test Symposium (ATS), 2011 20th Asian
Conference_Location :
New Delhi
Print_ISBN :
978-1-4577-1984-4
DOI :
10.1109/ATS.2011.51