• DocumentCode
    2803987
  • Title

    High Level Verification and Its Use at Pos-Silicon Debugging and Patching

  • Author

    Fujita, Masahiro

  • Author_Institution
    VLSI Design & Educ. Center (VDEC), Univ. of Tokyo, Tokyo, Japan
  • fYear
    2011
  • fDate
    20-23 Nov. 2011
  • Firstpage
    464
  • Lastpage
    469
  • Abstract
    In this paper, we first discuss about high level formal verification and analysis techniques targeting C-based designs. They are based on dependence traversal and analyze design descriptions locally. An equivalence checking technique based on dependence traversal of the difference between the two design descriptions is shown. Then we introduce special mechanisms called patchable accelerators, for post-silicon verification and debugging which can automatically be high level synthesized from C-based design descriptions. By using the patch logic in the synthesized accelerators, values of internal signals can be observed and controlled. With those information, a post-silicon debugging technique based on symbolic traverse of the dependency in C-based design description is developed.
  • Keywords
    computer debugging; elemental semiconductors; silicon; system-on-chip; C-based designs; Si; analysis techniques; equivalence checking technique; high level verification; internal signals; patchable accelerators; pos-silicon debugging; symbolic traverse; synthesized accelerators; Computer bugs; Debugging; Hardware; High level synthesis; Image edge detection; Registers; C-based design; debug; patch; post-silicon; testing; verification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ATS), 2011 20th Asian
  • Conference_Location
    New Delhi
  • ISSN
    1081-7735
  • Print_ISBN
    978-1-4577-1984-4
  • Type

    conf

  • DOI
    10.1109/ATS.2011.51
  • Filename
    6114776