DocumentCode
2803987
Title
High Level Verification and Its Use at Pos-Silicon Debugging and Patching
Author
Fujita, Masahiro
Author_Institution
VLSI Design & Educ. Center (VDEC), Univ. of Tokyo, Tokyo, Japan
fYear
2011
fDate
20-23 Nov. 2011
Firstpage
464
Lastpage
469
Abstract
In this paper, we first discuss about high level formal verification and analysis techniques targeting C-based designs. They are based on dependence traversal and analyze design descriptions locally. An equivalence checking technique based on dependence traversal of the difference between the two design descriptions is shown. Then we introduce special mechanisms called patchable accelerators, for post-silicon verification and debugging which can automatically be high level synthesized from C-based design descriptions. By using the patch logic in the synthesized accelerators, values of internal signals can be observed and controlled. With those information, a post-silicon debugging technique based on symbolic traverse of the dependency in C-based design description is developed.
Keywords
computer debugging; elemental semiconductors; silicon; system-on-chip; C-based designs; Si; analysis techniques; equivalence checking technique; high level verification; internal signals; patchable accelerators; pos-silicon debugging; symbolic traverse; synthesized accelerators; Computer bugs; Debugging; Hardware; High level synthesis; Image edge detection; Registers; C-based design; debug; patch; post-silicon; testing; verification;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ATS), 2011 20th Asian
Conference_Location
New Delhi
ISSN
1081-7735
Print_ISBN
978-1-4577-1984-4
Type
conf
DOI
10.1109/ATS.2011.51
Filename
6114776
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