• DocumentCode
    2804088
  • Title

    Automatic contrast enhancement of white matter lesions in FLAIR MRI

  • Author

    Khademi, April ; Venetsanopoulos, Anastasios ; Moody, Alan

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Toronto, Toronto, ON, Canada
  • fYear
    2009
  • fDate
    June 28 2009-July 1 2009
  • Firstpage
    322
  • Lastpage
    325
  • Abstract
    This work concerns the development of a novel contrast enhancement algorithm for FLAIR-weighted cerebral MRI with white matter lesions (WML). The proposed method utilizes both a robust estimate of edge magnitude and intensity values to discriminate between pathological and non-pathological information. These two features are combined through several transformations, such that WML are highlighted, and normal appearing white/gray matter are suppressed. The technique utilizes information solely computed from each image and thus adapts to the input image´s characteristics. The results show a significant improvement of the contrast between white matter lesions and other brain tissue (average contrast improvement of 41.1%). To demonstrate the robustness of such an enhancement scheme for WML analysis, a threshold-based segmenter is applied, which extracts the WML with good results.
  • Keywords
    biomedical MRI; brain; edge detection; feature extraction; image enhancement; image segmentation; medical image processing; wounds; FLAIR-weighted cerebral MRI; automatic contrast enhancement; brain tissue; feature extraction; fluid attenuation inversion recovery images; gray matter; nonpathological information; pathological information; robust estimation; threshold-based segmenter; white matter lesions; Biological tissues; Biomedical imaging; Diseases; Head; Image segmentation; Lesions; Magnetic resonance imaging; Multiple sclerosis; Pathology; Robustness; Image enhancement; biomedical image processing; image segmentation; medical diagnosis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2009. ISBI '09. IEEE International Symposium on
  • Conference_Location
    Boston, MA
  • ISSN
    1945-7928
  • Print_ISBN
    978-1-4244-3931-7
  • Electronic_ISBN
    1945-7928
  • Type

    conf

  • DOI
    10.1109/ISBI.2009.5193049
  • Filename
    5193049