Title :
A high speed laser package for optical communications
Author :
Lawson, P. ; Collins, J.V.
Author_Institution :
British Telecom Res. Labs., Ipswich, UK
Abstract :
Describes work which is currently being undertaken at British Telecom Research Laboratories (BTRL) in response to the demand for a highspeed laser package for a variety of system applications. At present, commercial packages are limited in bandwidth to a few gigahertz, whereas laser chips have been reported to at least 18 GHz. In order to evaluate these higher speed chips a test fixture is required, and for use in real systems, a package which meets practical electrical, optical, thermal, mechanical, and environmental conditions must be developed. A test fixture designed for laser chip assessment, and a package developed to host the laser and associated components are described, along with results obtained. The problems of intrapackage connection and interfacing are also addressed
Keywords :
integrated circuit testing; laser variables measurement; microwave measurement; optical communication equipment; semiconductor junction lasers; test equipment; 18 GHz; BTRL; British Telecom Research Laboratories; bandwidth; electrical conditions; environmental conditions; high speed laser package; interfacing; intrapackage connection; laser chips; mechanical conditions; microwave lasers; optical communications; optical conditions; test fixture;
Conference_Titel :
Microwave Optoelectronics, IEE Colloquium on
Conference_Location :
London