Title :
Improved registration for large electron microscopy images
Author :
Akselrod-Ballin, Ayelet ; Bock, Davi ; Reid, R. Clay ; Warfield, Simon K.
Author_Institution :
Med. Sch., Comput. Radiol. Lab., Harvard Univ., Boston, MA, USA
fDate :
June 28 2009-July 1 2009
Abstract :
In this paper we introduce a novel algorithm for alignment of Electron Microscopy images for 3D reconstruction. The algorithm extends the Expectation Maximization - Iterative Closest Points (EM-ICP) algorithm to go from point matching to patch matching. We utilize local patch characteristics to achieve improved registration. The method is applied to enable 3D reconstruction of Transmission Electron Microscopy (TEM) images. We demonstrate results on large TEM images and show the increased alignment accuracy of our approach.
Keywords :
expectation-maximisation algorithm; image reconstruction; image registration; medical image processing; transmission electron microscopy; expectation maximization-iterative closest points algorithm; image reconstruction; image registration; patch matching; point matching; transmission electron microscopy; Biomedical imaging; Circuits; Electron microscopy; Image reconstruction; Iterative algorithms; Laboratories; Pediatrics; Radiology; Robustness; Transmission electron microscopy; Microscopy; Reconstruction; Registration;
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2009. ISBI '09. IEEE International Symposium on
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-3931-7
Electronic_ISBN :
1945-7928
DOI :
10.1109/ISBI.2009.5193077
