Improved registration for large electron microscopy images

Author

Akselrod-Ballin, Ayelet ; Bock, Davi ; Reid, R. Clay ; Warfield, Simon K.

Author_Institution

Med. Sch., Comput. Radiol. Lab., Harvard Univ., Boston, MA, USA

fYear

2009

fDate

June 28 2009-July 1 2009

Firstpage

434

Lastpage

437

Abstract

In this paper we introduce a novel algorithm for alignment of Electron Microscopy images for 3D reconstruction. The algorithm extends the Expectation Maximization - Iterative Closest Points (EM-ICP) algorithm to go from point matching to patch matching. We utilize local patch characteristics to achieve improved registration. The method is applied to enable 3D reconstruction of Transmission Electron Microscopy (TEM) images. We demonstrate results on large TEM images and show the increased alignment accuracy of our approach.

Keywords

expectation-maximisation algorithm; image reconstruction; image registration; medical image processing; transmission electron microscopy; expectation maximization-iterative closest points algorithm; image reconstruction; image registration; patch matching; point matching; transmission electron microscopy; Biomedical imaging; Circuits; Electron microscopy; Image reconstruction; Iterative algorithms; Laboratories; Pediatrics; Radiology; Robustness; Transmission electron microscopy; Microscopy; Reconstruction; Registration;

fLanguage

English

Publisher

ieee

Conference_Titel

Biomedical Imaging: From Nano to Macro, 2009. ISBI '09. IEEE International Symposium on

Conference_Location

Boston, MA

ISSN

1945-7928

Print_ISBN

978-1-4244-3931-7

Electronic_ISBN

1945-7928

Type

conf

DOI

10.1109/ISBI.2009.5193077

Filename

5193077