Title :
Optical property characterization based on a phase function approximation model
Author :
Cong, A. ; Cong, W. ; Shen, H. ; Wang, G. ; Lu, Y. ; Chatziioannou, A.
Author_Institution :
VT-WFU Sch. of Biomed. Eng & Sci, Virginia Tech, Blacksburg, VA, USA
fDate :
June 28 2009-July 1 2009
Abstract :
Recently, we generalized the Delta-Eddington phase function and applied it to the radiative transfer equation for modeling the photon propagation in biological tissue. The resultant phase approximation model was shown to be highly accurate with a wide range of optical properties, including the strongly absorbing and weakly scattering media. In this paper, we propose phase-approximation-based method for estimating the optical parameters. Specifically, we design an iterative algorithm to take advantage of both the global search ability of the differential evolution algorithm and the efficiency of the conjugate gradient method. Then, we demonstrate the feasibility and merits of the proposed method in both numerical simulation and phantom experiments.
Keywords :
bio-optics; biological tissues; biology computing; biomedical optical imaging; conjugate gradient methods; evolutionary computation; iterative methods; medical computing; modelling; radiative transfer; search problems; Delta-Eddington phase function; biological tissue photon propagation; conjugate gradient method; differential evolution algorithm; global search ability; iterative algorithm; optical property characterization; phantom experiments; phase approximation based method; phase function approximation model; photon propagation modeling; radiative transfer equation; strongly absorbing media; weakly scattering media; Biological system modeling; Biological tissues; Biomedical optical imaging; Equations; Function approximation; Iterative algorithms; Optical propagation; Optical scattering; Parameter estimation; Particle scattering; Bioluminescence Tomography (BLT); Phase Approximation (PA);
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2009. ISBI '09. IEEE International Symposium on
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-3931-7
Electronic_ISBN :
1945-7928
DOI :
10.1109/ISBI.2009.5193080