Title :
A floating gate MOSFET dosimeter requiring no external bias supply
Author :
Tarr, N.G. ; Mackay, G.F. ; Shortt, K. ; Thomson, I.
Author_Institution :
Dept. of Electron., Carleton Univ., Ottawa, Ont., Canada
Abstract :
MOSFET dosimeters incorporating an electrically floating polysilicon gate have been fabricated in a commercial CMOS technology. Charge is placed on the floating gate by tunnelling from a small overlapping injector gate. Subsequent irradiation partially discharges the floating gate, producing a change in threshold voltage which can be used to infer the absorbed dose. No external power source is required during this sensing period. Sensitivities up to 70 mV Gy-1 (0.7 mV/rad) have been obtained for temperature-compensated matched-pair dosimeters under 60Co gamma irradiation
Keywords :
MOSFET; dosimeters; gamma-ray detection; silicon radiation detectors; CMOS technology; RADFET; Si; floating gate MOSFET dosimeter; gamma irradiation; injector gate; polysilicon gate; sensitivity; temperature compensated matched pair; threshold voltage; tunnelling; CMOS technology; Councils; Electron traps; Fault location; Ionizing radiation; Ionizing radiation sensors; MOSFET circuits; Physics; Threshold voltage; Tunneling;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 1997. RADECS 97. Fourth European Conference on
Conference_Location :
Cannes
Print_ISBN :
0-7803-4071-X
DOI :
10.1109/RADECS.1997.698909