DocumentCode
2805515
Title
Analysis and suppression of a common mode resonance in the cascaded H-bridge multilevel inverter
Author
Lai, Rixin ; Todorovic, Maja Harfman ; Sabate, Juan
Author_Institution
One Res. Circle, GE Global Res. Center, Niskayuna, NY, USA
fYear
2010
fDate
12-16 Sept. 2010
Firstpage
4564
Lastpage
4568
Abstract
The common mode (CM) voltage and current issues due to the parasitic ground capacitance have been well reported for the PWM converters. However, most of the previous work focused on the CM voltage generated at the motor side, or the input/output filter design for the standard compliance purpose. This paper identified a unique ground loop resonance phenomenon for the cascaded H-bridge multilevel inverter, which is generated internally due to the stray inductance of the bridge interconnection cable and the bus-to-ground parasitic capacitance. This resonance will increase the voltage and current stress in the power stage and therefore reduce the reliability of the system. The mechanism of the resonance is analyzed in detail and the corresponding suppression approach is discussed, proposing the preferred CM choke placement scheme. Simulation and experimental results provided verification of the resonance analysis and the effectiveness of the proposed suppression approach.
Keywords
PWM power convertors; invertors; power cables; power filters; reliability; PWM converters; bridge interconnection cable; bus-to-ground parasitic capacitance; cascaded H-bridge multilevel inverter; common mode resonance suppression approach; current stress; ground loop resonance phenomenon; input-output filter design; parasitic ground capacitance; preferred CM choke placement scheme; stray inductance; system reliability; voltage stress; Bridge circuits; Capacitors; Converters; Inductance; Inductors; Inverters; Resonant frequency; CM choke placement; Cascaded H-bridge multilevel inverter; ground loop resonance;
fLanguage
English
Publisher
ieee
Conference_Titel
Energy Conversion Congress and Exposition (ECCE), 2010 IEEE
Conference_Location
Atlanta, GA
Print_ISBN
978-1-4244-5286-6
Electronic_ISBN
978-1-4244-5287-3
Type
conf
DOI
10.1109/ECCE.2010.5618412
Filename
5618412
Link To Document