• DocumentCode
    2805539
  • Title

    Fault feature extracting by wavelet transform for control system fault detection and diagnosis

  • Author

    Ren, Zhang ; Chen, Jie ; Tang, Xiaojing ; Yan, Weisheng

  • Author_Institution
    Dept. of Electr. Eng., California Univ., Riverside, CA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    485
  • Lastpage
    489
  • Abstract
    The paper deals with the problem of fault feature extraction from the residual in the model-based control system fault detection and diagnosis, based on the fact that the wavelet transform of a signal will maximise the modulus at its singular point in the transform domain, and the fault error has positive singularity exponent while the noise has negative singularity exponent at the corresponding singular points; the fault error and noise mixed in the residual can be separated from each other by multi-scale wavelet transform, and the modulus maximum can be taken as the fault feature, so that the fault feature becomes clearer and more recognizable and a correct decision as to whether the system fault will take place or not can be correctly made in the transform domain. This makes it easy to detect and diagnose faults in the control system
  • Keywords
    control system analysis; fault diagnosis; feature extraction; optimisation; wavelet transforms; control systems; fault detection; fault diagnosis; fault feature extraction; model-based control system; optimisation; singularity; wavelet transform; Control system synthesis; Control systems; Decision making; Electrical fault detection; Error correction; Fault detection; Fault diagnosis; Feature extraction; Wavelet domain; Wavelet transforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control Applications, 2000. Proceedings of the 2000 IEEE International Conference on
  • Conference_Location
    Anchorage, AK
  • Print_ISBN
    0-7803-6562-3
  • Type

    conf

  • DOI
    10.1109/CCA.2000.897471
  • Filename
    897471