DocumentCode :
2805539
Title :
Fault feature extracting by wavelet transform for control system fault detection and diagnosis
Author :
Ren, Zhang ; Chen, Jie ; Tang, Xiaojing ; Yan, Weisheng
Author_Institution :
Dept. of Electr. Eng., California Univ., Riverside, CA, USA
fYear :
2000
fDate :
2000
Firstpage :
485
Lastpage :
489
Abstract :
The paper deals with the problem of fault feature extraction from the residual in the model-based control system fault detection and diagnosis, based on the fact that the wavelet transform of a signal will maximise the modulus at its singular point in the transform domain, and the fault error has positive singularity exponent while the noise has negative singularity exponent at the corresponding singular points; the fault error and noise mixed in the residual can be separated from each other by multi-scale wavelet transform, and the modulus maximum can be taken as the fault feature, so that the fault feature becomes clearer and more recognizable and a correct decision as to whether the system fault will take place or not can be correctly made in the transform domain. This makes it easy to detect and diagnose faults in the control system
Keywords :
control system analysis; fault diagnosis; feature extraction; optimisation; wavelet transforms; control systems; fault detection; fault diagnosis; fault feature extraction; model-based control system; optimisation; singularity; wavelet transform; Control system synthesis; Control systems; Decision making; Electrical fault detection; Error correction; Fault detection; Fault diagnosis; Feature extraction; Wavelet domain; Wavelet transforms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Control Applications, 2000. Proceedings of the 2000 IEEE International Conference on
Conference_Location :
Anchorage, AK
Print_ISBN :
0-7803-6562-3
Type :
conf
DOI :
10.1109/CCA.2000.897471
Filename :
897471
Link To Document :
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