Imaging of the compact range using super-resolution techniques

A method for locating the sources of spurious scattering in a compact range which involves a probe scanning of the field in the test zone is discussed. Such a field probe system has been incorporated as one of the options in the Ohio State University compact range measurement system. The received signal can be measured along an 8-ft linear track at various orientations. These data are then used to determine the position and magnitude of spurious scatterers in the range. The basic idea of the superresolution technique described is that probe measurement data can be parametrically modeled. In the present case, probe data due to the main beam and spurious signals consist of a sum of sinusoids. The algorithm parametrically extracts the amplitudes and frequencies of these sinusoids.<>