Title :
A fault-tolerant embedded microcontroller testbed
Author :
Rennels, David A. ; Caldwell, Douglas W. ; Hwang, Riki ; Mesarina, Malena
Author_Institution :
California Univ., Los Angeles, CA, USA
Abstract :
The paper presents a design approach for implementing a fault-tolerant embedded computing node based on the use of low-cost commodity microcontrollers. A combination of software and relatively simple external logic is used to implement fault-tolerance in a redundant set of microcontrollers. A node can be protected with different amounts of redundancy (duplex, triplex, hybrid) depending upon the needs of its host subsystem, and is intended to be interconnected with other nodes into a modular distributed network. The structure of the node, and fault detection and recovery algorithms are described, along with a description of an experimental testbed that is being implemented
Keywords :
circuit reliability; circuit testing; computer testing; fault tolerant computing; integrated circuit testing; microcontrollers; redundancy; reliability; system recovery; external logic; fault detection algorithm; fault recovery algorithm; fault-tolerant embedded computing node; fault-tolerant embedded microcontroller testbed; host subsystem; low-cost commodity microcontrollers; modular distributed network; redundancy; redundant microcontrollers; software; Circuit faults; Circuit testing; Embedded computing; Fault tolerance; Integrated circuit interconnections; Logic; Master-slave; Microcontrollers; Protection; Redundancy;
Conference_Titel :
Fault-Tolerant Systems, 1997. Proceedings., Pacific Rim International Symposium on
Conference_Location :
Taipei
Print_ISBN :
0-8186-8212-4
DOI :
10.1109/PRFTS.1997.640118
