DocumentCode :
2806395
Title :
Improved method for characterizing transmission lines using frequency-domain measurements
Author :
Oh, Kyung Suk Dan ; Yuan, Xingchao Chuck
Author_Institution :
Rambus Inc., Los Altos, CA, USA
fYear :
2004
fDate :
25-27 Oct. 2004
Firstpage :
127
Lastpage :
130
Abstract :
This work presents an improved and accurate methodology for extracting lossy frequency-dependent transmission parameters from S-parameter measurements. The presented technique first uses the multiline method to accurately determine the propagation constant. Then, it proposes a new approach to compute the characteristic impedance by determining the admittance first, based on the fact that the admittance can be modeled as a linear function of frequency. This process ensures both frequency dependent conductor and dielectric losses are accurately determined. It is demonstrated, through several practical examples, that the resulting transmission line parameter is free of common modeling errors at resonant frequencies.
Keywords :
S-parameters; dielectric losses; electric admittance; electric impedance; frequency-domain analysis; microstrip lines; transmission lines; S-parameter measurements; admittance determination; characteristic impedance; dielectric losses; frequency dependent conductor; frequency domain measurements; linear function; lossy frequency; microstrip lines; modeling errors; multiline method; propagation constant; resonant frequencies; transmission line parameter; Admittance; Dielectric losses; Frequency dependence; Frequency measurement; Impedance; Loss measurement; Propagation constant; Propagation losses; Scattering parameters; Transmission line measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Performance of Electronic Packaging, 2004. IEEE 13th Topical Meeting on
Print_ISBN :
0-7803-8667-1
Type :
conf
DOI :
10.1109/EPEP.2004.1407564
Filename :
1407564
Link To Document :
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