• DocumentCode
    2806395
  • Title

    Improved method for characterizing transmission lines using frequency-domain measurements

  • Author

    Oh, Kyung Suk Dan ; Yuan, Xingchao Chuck

  • Author_Institution
    Rambus Inc., Los Altos, CA, USA
  • fYear
    2004
  • fDate
    25-27 Oct. 2004
  • Firstpage
    127
  • Lastpage
    130
  • Abstract
    This work presents an improved and accurate methodology for extracting lossy frequency-dependent transmission parameters from S-parameter measurements. The presented technique first uses the multiline method to accurately determine the propagation constant. Then, it proposes a new approach to compute the characteristic impedance by determining the admittance first, based on the fact that the admittance can be modeled as a linear function of frequency. This process ensures both frequency dependent conductor and dielectric losses are accurately determined. It is demonstrated, through several practical examples, that the resulting transmission line parameter is free of common modeling errors at resonant frequencies.
  • Keywords
    S-parameters; dielectric losses; electric admittance; electric impedance; frequency-domain analysis; microstrip lines; transmission lines; S-parameter measurements; admittance determination; characteristic impedance; dielectric losses; frequency dependent conductor; frequency domain measurements; linear function; lossy frequency; microstrip lines; modeling errors; multiline method; propagation constant; resonant frequencies; transmission line parameter; Admittance; Dielectric losses; Frequency dependence; Frequency measurement; Impedance; Loss measurement; Propagation constant; Propagation losses; Scattering parameters; Transmission line measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging, 2004. IEEE 13th Topical Meeting on
  • Print_ISBN
    0-7803-8667-1
  • Type

    conf

  • DOI
    10.1109/EPEP.2004.1407564
  • Filename
    1407564